AMERI focuses on solving complex technological challenges with high-tech solutions. By combining client needs with advanced tools for analysis, design, fabrication and testing, AMERI takes a well-rounded approach to research, product development and innovation.
Our Labs
Analytical Laboratory
AMERI offers a full range of analytical tools, including four electron microscopes, thermal processing systems, metallography equipment and materials testing tools.
Motorola Nanofabrication Research Facility
Our state-of-the-art MEMS and nanofabrication facility features a 2,000-square-foot cleanroom and fully equipped materials research labs. The space is open access and supported by dedicated administrative and technical staff.
Services and Tools
Faculty, students and industry partners all use AMERI to turn bold ideas into real breakthroughs.
| Tool | Description | Picture | Model |
|---|---|---|---|
| Jar Mill Roller | Used for grinding, mixing, and homogenizing powders and slurries by driving cylindrical jars with grinding media enabling fine particle size reduction and uniform material blending. |  | US Stoneware |
| Sample Prep Ultrasonicator | Uses high-frequency sound waves in a liquid bath to remove contaminants from samples, glassware, and tools. |  | Branson 2210 Ultrasonic Cleaner |
| Dicing Saw | Used to cut hard and brittle materials such as semiconductors, ceramics, and crystals employing a high-speed rotating blade to produce clean, accurate cuts. |  | Micro Automation M-1006 |
| Electropolisher | Used to prepare metallographic samplles by removing surface layers through electrochemical polishing. |  | Buehler Electromet 4 |
| High Speed Saw | Uses a thin abrasive blade to cut metals, ceramics, and composites. |  | Allied High Tech Products TechCut 5 |
| Hot Plate | Used to heat and mix liquid samples. |  | Barnstead Thermolyne Super-Nuova |
| Medium Speed Saw | A precision saw used to section delicate or brittle materials with minimal deformation or heat damage. |  | Buehler IsoMet 1000 Precision Saw |
| Polishing Wheel | Used for grinding and polishing metallographic samples. |  | Buehler EcoMet Grinder Polisher |
| KJLC PVD Evaporator | A high-vacuum sputtering system for thin-film deposition. |  | Kurt J. Lesker PVD 200 Pro-Line |
| Allwin21 Asher | A plasma processing system for photoresist removal, descumming, and surface cleaning. |  | Allwin21 AW-B3000 Plasma Asher/Descum System |
| Allwin21 RTP | Used for high-precision heating of wafers and materials. |  | Allwin21 AccuThermo AW610M RTP |
| Cleanroom Furnace | Designed for precise heat treatment under controlled environments. |  | Across International Atmosphere-Controlled Muffle Furnace GCF1200-12X8X8 |
| MARCH RIE | A plasma cleaning and etching system designed for surface preparation, descum, and ashing applications. |  | March CS-1701C |
| PlasmaEtch RIE | A high-frequency plasma cleaner and etcher sued for surface treatment, photoresist removal, and descum applications. |  | Plasma Etch PE-100HF Plasma System |
| PVD Sputtering | Used for thin-film deposition via physical vapor deposition by sputtering target materials onto substrates in a controlled vacuum environment. |  | Pfeiffer Vacuum Technology, Aja International Controls |
| STS ICP DRIE | An inductively coupled plasma system used for deep, anisotropic etching of materials such as silicon and thin films. |  | Surface Technology Systems Multiplex ICP Etcher |
| Litho Optical Microscope | Upright optical microscope designed for transmitted and reflected light imaging. |  | Olympus BX60 |
| OAI (800) Mask Aligner | A photolithography sytem used to transfer microscale patterns onto substrates via UV light exposure though a photomask. |  | OAI 800 |
| Cleanroom Ultra Sonicator | Uses high-frequency sound waves in a heated liquid bath to remove contaminants from samples, tools, and glassware. |  | Vevor Digital Ultrasonic Cleaner |
| Vacuum Oven | Used for drying and curing samples under reduced pressure. |  | PRECISION Vacuum Oven |
| Optical Profiler | Non-contact optical profiler used to measure surface topography with nanometer precision. |  | Filmetrics Profilm3D Optical Profilometer |
| SEM 7000 with Electron Beam Lithography | A field emission scanning electron microscope designed for high-resolution imaging and advanced microanalysis. The system is enhanced with a beam blanker providing electron beam lithography capability. |  | JEOL JSM-7000F/Deben PCD Beam Blanker |
| Metallograph Microscope | High-resolution upright microscope that enables brightfield imaging. |  | ZEISS Axioscope 5 |
| Micro-indentation Hardness Tester | Measures material hardness using Vickers or Knoop methods with high precision. |  | LECO LM810AT |
| Microscopy Ultra Sonicator | Uses high-frequency sound waves in a liquid bath to remove contaminants from samples, tools, and glassware. |  | Branson 2510 Ultrasonic Cleaner |
| Sample Coater Au | Used to deposit thin conductive films of gold onto non-conductive samples, preventing charging and enhances imaging quality in scanning electron microscopy (SEM). |  | Pelco SC-7 Auto Sputter Coater |
| Sample Coater C | Used to deposit thin, condutive carbon films on samples for SEM and electron microprobe analysis. |  | Pelco CC-7A SEM Carbon Coater |
| SEM F100 | A field emission scanning electron microscope (FE-SEM) that provides ultra-high-resolution imaging of surfaces at the nanometer scale with option for elemental characterization using energy-dispersive X-ray spectroscopy (EDS). |  | JEOL JSM-F100 |
| JIB 4500 | A dual-beam system that combines a high-performance SEM for imaging with a focused ion beam (FIB) for milling and cross-sectioning, and EDS for elemental analysis. Equipped with an Omniprobe micromanipulator, it enables site-specific sample prepartation, TEM lamella lift-outs, and advanced micro- and nano-scale characterization. |  | JEOL JIB-4500 |
| TEM | High-resolution transmission electron microscope (TEM) that provides atomic- to nanometer-scale imaging of materials. |  | JEOL JEM-2100Plus |
| Dynamic Light Scattering | Measures particle size and zeta potential in liquid dispersions. |  | Anton Paar LiteSizer 500 |
| Gas Sorption Analyzer | Used to measure surface area, pore size, and pore volume of solid materials. |  | Anton Paar Nova 600 |
| Parylene Coater | Coats substrates with thin, uniform, pinhole-free polymer films. |  | SCS PDS Labcoter 2 |
| SDT | Performs simultaneous DSC-TGA (SDT) measuring both heat flow and weight change of a material as it is heated, cooled, or held at temperature. |  | TA Instruments Q600 SDT |
| FTIR | Provides sensitivity measurements of molecular vibrations, enabling analysis of functional groups, bonding structures, and material composition to identify and characterize chemical compounds. |  | Shimadzu IRTracer-100 |
| XRD Siemens | Used to analyze the crystal structure of materials. Provides phase identification, lattice parameter determination, and information on crystallinity, grain size, and texture for powders, thin films, and bulk samples. |  | Siemens D5000 X-ray Diffractometer |
| XRD Bruker | Compact high-performance X-ray diffractometer designed for phase identification and structural analysis of crystalline materials. |  | Bruker D6 PHASER |
| Dektak Profilometer | A stylus profilometer used to measure thin film thickness, step height, and surface roughness. |  | Bruker Dektak Pro Profiler |
| Thermal Evaporator | A vacuum thin-film deposition system widely used for creating high-quality coatings of metals, dielectrics, and other materials. |  | Edwards Auto 306 |
| Direct Write Lithography | A maskless direct-write lithography tool designed for rapid prototyping of micro- and nano-scale structures. |  | Nanyte BEAM |